Description
Chromatic Confocal Displacement Sensor

| Parameters | ||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Sensor Head | ||||||||||||||||
| Model*7 | Reference Distance*1 | Measurement Range | Angle*2 | Spot type*3 | Repeat- ability | Linear Error*5 | Outer Diameter *Length | Weight | Minimum Measurabl e Thickness | Temperature Characteristics | IP Grade |
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| C100B | 8mm | ±0.05mm | ±46.5。 | Φ2.7μm/5.4μm/43.2μm | 3nm | <±0.03μm | Φ40*111.5mm | 256g | 5%ofF.S. | <0.03% F.S./。C | IP40 | |||||
| C400 | 10mm | ±0.2mm | ±43。 | Φ7μm/14μm/112μm | 12nm | <±0.12μm | Φ40*99.4mm | 186g | ||||||||
| C600 | 6.5mm | ±0.3mm | ±32.5。 | Φ8μm/16μm/128μm | 16nm | <±0.18μm | Φ20*110mm | 73g | ||||||||
| C1200 | 20mm | ±0.6mm | ±32。 | Φ9.5μm/19μm/152μm | 30nm | <±0.3μm | Φ36*106.3mm | 182g | ||||||||
| C2000 | 50mm | ±1mm | ±14。 | Φ20μm/40μm/320μm | 85nm | <±0.6μm | Φ34*90.7mm | 162g | 10%ofF.S. | ≈0.1% F.S./。C |
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| C2400 | 9mm | ±1.2mm | ±60。 | Φ5.5μm/11μm/88μm | 45nm | <±0.48μm | Φ94*267.5mm | 2350g | 5%ofF.S. | <0.03% F.S./。C |
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| C2600 | 15mm | ±1.3mm | ±31。 | Φ9μm/18μm/144μm | 50nm | <±0.3μm | Φ36*97.9mm | 228g | ||||||||
| C2600H | 15mm | ±1.3mm | ±31。 | Φ9μm/18μm/144μm | 50nm | <±0.3μm | Φ36*97.9mm | 228g | ||||||||
| C3000 | 7mm | ±1.5mm | ±12.5。 | Φ20μm | 100nm | <±0.6μm | Φ8*65.7mm | 23g*6 | 10%ofF.S. | ≈0.05% F.S./。C | IP67 | |||||
| C4000N | 14.5mm | ±2mm | ±21。 | Φ12μm/24μm/192μm | 100nm | <±0.8μm | Φ32*158.8mm | 238g | 5%ofF.S. | <0.03% F.S./。C | IP40 | |||||
| C4000F | 38mm | ±2mm | ±21。 | Φ16μm/32μm/256μm | 100nm | <±0.8μm | Φ36*126.1mm | 226g | ||||||||
| C6000 | 40mm | ±3mm | ±14。 | Φ22μm/44μm/352μm | 140nm | <±1.2μm | Φ30*65.3mm | 112g | ≈0.05% F.S./。C |
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| C7000 | 45mm | ±3.5mm | ±15.5。 | Φ20μm/40μm/320μm | 140nm | <±1.4μm | Φ36*84.2mm | 200g | <0.03% F.S./。C |
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| C7000L | 47mm | ±3.5mm | ±21。 | Φ16μm/32μm/256μm | 140nm | <±1.4μm | Φ52*207mm | 784g | ||||||||
| C7000S | 70mm | ±3.5mm | ±10。 | Φ25μm/50μm/400μm | 200nm | <±1.4μm | Φ30*84.2mm | 130g | ||||||||
| C8000 | 54.5mm | ±4mm | ±7.3。 | Φ34μm / 68μm / 544μm | 250nm | <±1.6μm | Φ23*50mm | 29g | ||||||||
| C8000(Bent) | 54.5mm | ±4mm | ±7.3。 | Φ34μm / 68μm / 544μm | 250nm | <±1.6μm | Φ23*48.5mm | |||||||||
| C10000 | 50mm | ±5mm | ±13。 | Φ20μm/40μm/320μm | 250nm | <±2μm | Φ36*84mm | 203g | ||||||||
| C10000H | 50mm | ±5mm | ±13。 | Φ20μm/40μm/320μm | 250nm | <±2μm | Φ36*84mm | / | ||||||||
| C16000 | 55mm | ±8mm | ±15.3。 | Φ15μm/30μm/240μm | 300nm | <±2μm | Φ60*211.1mm | 1180g | ||||||||
| C20000 | 60mm | ±10mm | ±10.5。 | Φ25μm/50μm/400μm | 290nm | <±2μm | Φ36*163mm | 310g | ||||||||
| C20000H | 60mm | ±10mm | ±10.5。 | Φ25μm/50μm/400μm | 290nm | <±2μm | Φ36*163mm | 670g | ||||||||
| C50000 | 100mm | ±25mm | ±9.5。 | Φ25μm/50μm/400μm | 850nm | <±5μm | Φ60*217.3mm | 1154g | ||||||||
| CR1500 | Axial:3.92mm | ±0.75mm | ±14。 | Φ20μm | 80nm | <±0.3μm | Φ8*68.8mm | 23g*6 | 10%ofF.S. | |||||||
| Radial:5.75mm | Φ8*70.2mm | |||||||||||||||
| CR1500N | Axial:1.7mm | ±0.75mm | ±12。 | Φ17μm | 100nm | <±0.75μm | Φ3.8*85mm | 23g*6 | ||||||||
| Radial:3mm | ||||||||||||||||
| CR4000 | Axial:4.7mm | ±2mm | ±12.5。 | Φ20μm | 100nm | <±1.2μm | Φ8*73.1mm | 59g*6 | ||||||||
| Radial:8mm | ||||||||||||||||
| CR5000 | Axial:6.75mm | ±2.5mm | ±13。 | Φ19μm | 100nm | <±1μm | Φ12*94.6mm | 37g*6 | <0.02% F.S./。C |
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| Radial:12mm | ||||||||||||||||
| *1 Calculated from the center position of the measurement range; *2 Tilt test using standard flat mirror at 1kHz Sampling Rate; |
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| *3 Measurement of sharp glass edges, verified with a sub-micron positioning accuracy motion platform and laser interferometer as the displacement reference, the spot diameter values correspond to the diameters of small spot/large spot/four-spot pattern; |
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| *4 Measurement of standard silver-coated mirror, 1kHz without averaging, root mean square deviation of 10,000 continuous data sets; *5 Calibration verification using high-precision nanoscale laser interferometer; |
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| *6 This head model includes a 3m tail cable, and the weight in the table includes the weight of the cable; | ||||||||||||||||
| *7 The CR series is available in two configurations: axial and radial light emission. The different suffixes are distinguished as follows:N for near reference distance,F for far reference distance,S for small size,L for Large size,H for high-temperature version. |
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| Controller(CC-) | ||||||||||||||||
| Model | CCS | CCD | CCF | |||||||||||||
| Head Connection Capacity | 1 | 2 | 4 | |||||||||||||
| Sampling Rate | 1 channel: Max.10 kHz; 2 channels: Max.5 kHz; 4 channels: Max.2.5 kHz | |||||||||||||||
| Input Po比 | Encoder Input | AB / ABZ encoder input, configurable for trigger | ||||||||||||||
| Trigger Signal Input | Pulse / Level trigger | |||||||||||||||
| Output Po比 | Digital Signal Output | Alarm output, comparator output (Configurable as comparator output or data invalid warning) |
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| Analog Signal Output | Linear ±10 V analog voltage output / 4~20 mA analog current output (Optional) |
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| Industrial Interface | Ethernet | 100BASE-TX | ||||||||||||||
| USB | Complies with USB2.0 Full-speed standard | |||||||||||||||
| RS-485 | Modbus protocol, 19200~115200 baud rate | |||||||||||||||
| EtherCAT | \ | |||||||||||||||
| Measurement & Control Software | Host Computer Software | TSConfocalStudio measurement & control software | ||||||||||||||
| SDK | C++&C#SDK | |||||||||||||||
| 08 | ||||||||||||||||
| \ \ Parameters | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| (Continued table) | |||||||||
| Rated Power | Supply Voltage | 24VDC±10% | |||||||
| Current Consumption | 0.4A | ||||||||
| Environmental Tolerance | Operating Temperature | 0 to +50oC | |||||||
| Relative Humidity | 20 to 85% RH(No condensation) | ||||||||
| Weight | 2000g | ||||||||
| Controller(CCH) | |||||||||
| Model | CCH | ||||||||
| Head Connection Capacity | Suppo忙s up to 16 sensor heads connected simultaneously. | ||||||||
| Sampling Rate | 1 Channel: Max. 20 kHz; 2 Channel:Max. 18 kHz; 4 Channel: Max. 12.5 kHz; 6 Channel: Max. 10 kHz; 6 Channel: Max. 10 kHz; 8 Channel: Max. 8 kHz; 12 Channels: Max. 6 kHz; 16 Channel: Max. 4 kHz |
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| Input Po比 | Encoder Input | AB / ABZ encoder input, configurable for trigger | |||||||
| Trigger Signal Input | Pulse / Level trigger | ||||||||
| Output Po比 | Digital Signal Output | Alarm output, comparator output (configurable as comparator output or data invalid warning) | |||||||
| Analog Signal Output | Linear 0~5V/0~10V/±5V/±10V analog voltage output / 4~20mA analog current output (Optional) | ||||||||
| Industrial Interface | Ethernet | 1000/100Mbps | |||||||
| USB | USB2.0 High-speed (480Mbps) | ||||||||
| RS-485 | Modbus protocol, 19200~115200 baud rate | ||||||||
| EtherCAT | 100Mbps(Optional) | ||||||||
| Measurement & Control Software | Host Computer Software | TSConfocalStudio measurement & control software | |||||||
| SDK | C++&C#SDK | ||||||||
| Rated Power | Supply Voltage | 24 VDC±10% | |||||||
| Current Consumption | 0.5A (1 channel), 4A (16 channels) ,recommended power supply 24V 6A or above | ||||||||
| Environmental Tolerance | Operating Temperature | 0 to +50oC | |||||||
| Relative Humidity | 20 to 85% RH(No condensation) | ||||||||
| Weight | Approx.2800g(Related channel number & configuration) | ||||||||
| Controller(CP-*) | |||||||||
| Model | CPS / CPS-L | CPD / CPD-L | CPF | ||||||
| Head Connection Capacity | 1 | 2 | 4 | ||||||
| Sampling Rate | 1 channel: Max.32 kHz; 2 channels: Max.16 kHz; 4 channels: Max.8 kHz | ||||||||
| Input Po比 | Encoder Input | AB / ABZ encoder input, configurable for trigger | |||||||
| Trigger Signal Input | Pulse / Level trigger | ||||||||
| Output Po比 | Digital Signal Output | Alarm output, comparator output (Configurable as comparator output or data invalid warning) | |||||||
| Analog Signal Output | Linear ±10 V analog voltage output / 4~20 mA analog current output (Optional) | ||||||||
| Industrial Interface | Ethernet | 100BASE-TX | |||||||
| USB | USB2.0 High-speed (480Mbps) | ||||||||
| RS-485 | Modbus protocol, 19200~115200 baud rate | ||||||||
| EtherCAT | 100Mbps(Optional) | ||||||||
| Measurement & Control Software | Host Computer Software | TSConfocalStudio measurement & control software | |||||||
| SDK | C++&C#SDK | ||||||||
| Rated Power | Supply Voltage | 24 VDC±10% | |||||||
| Current Consumption | 1.0 A | ||||||||
| Environmental Tolerance | Operating Temperature | 0 to +50oC | |||||||
| Relative Humidity | 20 to 85% RH(No condensation) | ||||||||
| Weight | 3200 g | ||||||||
| * This model is a new product. The drawings are still being perfected丿 and the actual parameters may vary slightly. The contract shall prevail. | |||||||||
09 | |||||||||
Applications of Chromatic Confocal Displacement Sensors
Our high-precision chromatic confocal displacement sensor provides non-contact, ultra-precise measurement solutions across various advanced manufacturing and optical assembly fields, including:</p >
1. Transparent Wafer Thickness Measurement
In semiconductor and optical wafer manufacturing, measuring the precise thickness of transparent substrates (such as silicon, glass, quartz, and sapphire wafers) is critical. Thanks to its spectral chromatic dispersion principle, a single chromatic confocal displacement sensor can measure both the upper and lower surfaces of transparent materials simultaneously. It provides sub-nanometer thickness measurement without physical contact or thermal disruption, making it ideal for thin film thickness monitoring, wafer warpage detection, and inline quality control during polishing and grinding processes.</p >
2. Optical Transceiver and Coupler Alignment & Metrology
For optoelectronic manufacturing, the production of optical transceivers and fiber couplers requires sub-micron alignment accuracy to ensure optimal light coupling efficiency and minimize signal loss. Our chromatic confocal displacement sensor is extensively used to measure critical dimensions, air gaps, lens distances, and end-face tilts during optical assembly. Its non-contact high-frequency sampling (up to 30 kHz) guarantees precise positioning of optical fibers, PLC splitters, and transceiver components without scratching delicate optical coatings or mirror-like surfaces.</p >
3. Advanced Surface Micro-Topography & Precision Metrology
Beyond semiconductors and optical communications, these sensors are widely applied in consumer electronics, automotive optics, and precision machining to measure micro-grooves, step heights, surface roughness, and curvature on mirrored, polished, or highly angled surfaces.</p >





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