interferometer

Explore our advanced White Light and Infrared Interferometers, engineered for non-contact high-precision sub-micron surface profiling, film thickness measurement, and optical metrology. Utilizing white light white-light scanning interferometry (WSI) and infrared spectral interferometry, these sensors deliver nanometer-level vertical resolution across transparent, semi-transparent, highly reflective, and multi-layered materials. Ideal for semiconductor wafer inspection, optical coating analysis, glass thickness measurement, and precision surface roughness testing